| 摘要 |
A semiconductor integrated circuit comprises a substrate including a plurality of transistors, and a conductive line for coupling at least two of the transistors with each other, each transistor comprising a drain diffusion region, a source diffusion region, a gate region, and a test diffusion region within the substrate, the test diffusion region being electrically coupled to a metal line within the semiconductor integrated circuit for establishing an indication of the voltage at the probing diffusion region.
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