| 摘要 |
PURPOSE: A unit pixel testing device of thin-film micromirror array-actuated(TMA) applies various test signals of real driving signal to a test module and detects the driving state of AMA pixel of the test module, thereby measuring the performance characteristic of a unit pixel. CONSTITUTION: A test signal generator(510) generates plural top test signals and plural bottom test signals by using a clock pulse, a composite synchronizing signal and a vertical synchronizing signal, and provides the top and bottom test signals to a top test signal selector(520) and a bottom test signal selector(530) respectively. The top test signal selector(520) comprises a top switch(523) for selecting the top test signal of high pulse width to be applied to a test module(540) among the various test signals, and a top variable amplifier(526) for adjusting the signal level of the top test signal selected by the top switch(523). The bottom test signal selector(530) comprises a bottom switch(533) for selecting the bottom test signal of high pulse width to be applied to a test module(540) among the various test signals, and a bottom variable amplifier(536) for adjusting the signal level of the bottom test signal selected by the bottom switch(533). The test module(540) is tilted by depending on the top test signal selected by the top test signal selector(520) and the bottom test signal selected by the bottom test signal selector(530).
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