| 摘要 |
<p>The semiconductor memory device in accordance with the present invention allows evaluation of input/output terminal dependency of noise characteristic at the time of data output, it has a normal operation mode and a test mode, and includes a plurality of output buffers (11, 13, 15, 36) and selecting means (22, 32, 34) for selectively activating at least one output buffer among the plurality of output buffers in the test mode. <IMAGE></p> |
