发明名称 Programmable sense amplifier delay (PSAD) circuit which is matched to the memory array
摘要 A programmable sense amplifier delay (PSAD) circuit that is matched to the response of the memory array due to temperature and voltage supply Vcc. The circuit includes an inverter, a pull-up transistor, a pull-down transistor of the type of the cells of the memory array and a plurality of capacitors. The inverter responds to a predetermined voltage drop between the voltage level of the voltage source and the voltage on the input line. The pull-up transistor is connected between the voltage source Vcc and the input line and is activatable during a pre-charge phase of the memory array to raise the voltage level of the input line towards the voltage source. The pull-down transistor is connected between the input line and a ground source and is activatable after the pre-charge phase to discharge the voltage level of the input line. The capacitors are selectively connected in parallel to the pull-down transistor and define the speed at which the pull-down transistor discharges the input line. The invention also incorporates the voltage drop inverter.
申请公布号 US6072733(A) 申请公布日期 2000.06.06
申请号 US19970953690 申请日期 1997.10.17
申请人 WAFERSCALE INTEGRATION, INC. 发明人 ADVANI, MANIK
分类号 G11C7/06;G11C7/22;G11C16/26;(IPC1-7):G11C7/00 主分类号 G11C7/06
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