发明名称 |
Programmable sense amplifier delay (PSAD) circuit which is matched to the memory array |
摘要 |
A programmable sense amplifier delay (PSAD) circuit that is matched to the response of the memory array due to temperature and voltage supply Vcc. The circuit includes an inverter, a pull-up transistor, a pull-down transistor of the type of the cells of the memory array and a plurality of capacitors. The inverter responds to a predetermined voltage drop between the voltage level of the voltage source and the voltage on the input line. The pull-up transistor is connected between the voltage source Vcc and the input line and is activatable during a pre-charge phase of the memory array to raise the voltage level of the input line towards the voltage source. The pull-down transistor is connected between the input line and a ground source and is activatable after the pre-charge phase to discharge the voltage level of the input line. The capacitors are selectively connected in parallel to the pull-down transistor and define the speed at which the pull-down transistor discharges the input line. The invention also incorporates the voltage drop inverter.
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申请公布号 |
US6072733(A) |
申请公布日期 |
2000.06.06 |
申请号 |
US19970953690 |
申请日期 |
1997.10.17 |
申请人 |
WAFERSCALE INTEGRATION, INC. |
发明人 |
ADVANI, MANIK |
分类号 |
G11C7/06;G11C7/22;G11C16/26;(IPC1-7):G11C7/00 |
主分类号 |
G11C7/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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