发明名称 METHOD FOR REGULATING IMAGE AND STRUCTURE OF APERTURE PLATE IN SEMICONDUCTOR EXPOSURE EQUIPMENT
摘要 PURPOSE: A method for regulating an image and a structure of an aperture plate are provided to acquire a constant exposure rate even though pattern apertures are not same, and to acquire a constant strength from Diffraction light of low and high orders. CONSTITUTION: A crystal plate is installed in projection lenses between a mask and a wafer. A full blocking film of a circular shape is attached at an edge of the crystal plate. A half blocking film is attached at center of the crystal plate, so that an incidence hole of a circular shape is prepared at an inner side of the full blocking film. Diffraction light is generated from a mask pattern. Differection light of low order passes through the half blocking film. Differection light of high order passes through the incidence hole.
申请公布号 KR20000032075(A) 申请公布日期 2000.06.05
申请号 KR19980048416 申请日期 1998.11.12
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 PARK, JEONG GWON
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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