发明名称 |
METHOD FOR REGULATING IMAGE AND STRUCTURE OF APERTURE PLATE IN SEMICONDUCTOR EXPOSURE EQUIPMENT |
摘要 |
PURPOSE: A method for regulating an image and a structure of an aperture plate are provided to acquire a constant exposure rate even though pattern apertures are not same, and to acquire a constant strength from Diffraction light of low and high orders. CONSTITUTION: A crystal plate is installed in projection lenses between a mask and a wafer. A full blocking film of a circular shape is attached at an edge of the crystal plate. A half blocking film is attached at center of the crystal plate, so that an incidence hole of a circular shape is prepared at an inner side of the full blocking film. Diffraction light is generated from a mask pattern. Differection light of low order passes through the half blocking film. Differection light of high order passes through the incidence hole.
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申请公布号 |
KR20000032075(A) |
申请公布日期 |
2000.06.05 |
申请号 |
KR19980048416 |
申请日期 |
1998.11.12 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
PARK, JEONG GWON |
分类号 |
H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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