发明名称 METHOD OF DIAGNOSING INVERTER FAULTS
摘要 PROBLEM TO BE SOLVED: To locate the faulty semiconductor device of an inverter device, and moreover to aim at downsizing and reduction of the number of wirings among related apparatuses. SOLUTION: This system is provided with the gate drive power sources 21-23 which supply the semiconductor elements Q1-Q4 for each unit of inverter units 11-13 with gate drive power via gate drive circuits 31-34, a constant current source 8 which charges a smoothing capacitor Cf of each unit with DC constant currents and issues a signal when the charge voltage of each capacitor reaches a predetermined value, a control circuit 6 which directs normal inverter operation and in addition turns on or turns off the elements Q1-Q4 of each unit mentioned, according to a prescribed order at fault diagnosis, and a fault decision display circuit 7 which decides on each propriety of the time required for charging and locates the semiconductor device of each units in faulty conditions.
申请公布号 JP2000152635(A) 申请公布日期 2000.05.30
申请号 JP19990347037 申请日期 1999.12.07
申请人 FUJI ELECTRIC CO LTD 发明人 HISAMOTO MASAAKI;NOMURA TOSHIHIRO;AIKAWA ITSUZO
分类号 G01R31/02;G01R31/00;G05F1/10;H02M7/48;H02M7/497;H02M7/537 主分类号 G01R31/02
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