发明名称 |
Method for determining the efficiency of a planarization process |
摘要 |
A method for measuring the planarization efficiency of a planarization process and a device for use with the method are provided. The device may be a substrate having a set of isolated features, such as trenches or hills, with different widths. In the method, a removable layer of material is formed over the substrate. The substrate features form corresponding features in the removable layer with varying dimensions. A pre-planarization thickness of the removable layer of material is measured at each feature and at one or more of isolation areas. The removable layer of material is then planarized using a planarization process associated with one or more process parameters. A post-planarization thickness of the removable is measured at each feature and at one or more of the isolation regions. The planarization efficiency of the planarization process is then determined as a function of the dimensions of the substrate features or corresponding features in the removable layers and/or one or more process parameters. The determined planarization efficiency may be output by, for example, generating a graph of the planarization efficiency or using the planarization efficiency to change one or more parameters of the planarization process.
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申请公布号 |
US6057068(A) |
申请公布日期 |
2000.05.02 |
申请号 |
US19980205483 |
申请日期 |
1998.12.04 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
RAEDER, CHRISTOPHER H.;BROWN, THOMAS;BURKE, PETER A. |
分类号 |
B24B49/00;H01L21/306;(IPC1-7):G03F9/00 |
主分类号 |
B24B49/00 |
代理机构 |
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