发明名称 CAPACITOR OF SEMICONDUCTOR DEVICE AND ITS MANUFACTURE
摘要 PROBLEM TO BE SOLVED: To restrain increase of a contact resistance by preventing oxidation of a diffusion prevention film by forming a second conductive film pattern for a capacitor lower electrode filling up a second contact hole and forming a high dielectric film and a third conductive film pattern for a capacitor upper electrode. SOLUTION: A second layer insulation film pattern 41 with a second contact hole 40 which exposes a surface of a first conductive film pattern 39 is formed on a first layer insulation film pattern 33 and a first conductive film pattern 39. A second conductive film pattern 43 for a capacitor lower electrode is formed to be connected to the first conductive film pattern 39 filling in a second contact hole. A high dielectric film 45 is formed to enclose the second conductive film pattern 43. A third conductive film pattern 47 for a capacitor upper electrode is formed on the high dielectric film 45. As a result, a contact resistance can be reduced by preventing oxidation of the diffusion prevention film pattern 37.
申请公布号 JP2000124426(A) 申请公布日期 2000.04.28
申请号 JP19990189645 申请日期 1999.07.02
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 LEE BYOUNG-TAEK
分类号 H01L23/522;H01L21/02;H01L21/28;H01L21/285;H01L21/768;H01L21/822;H01L21/8242;H01L27/04;H01L27/10;H01L27/108;H01L29/43;H01L29/92 主分类号 H01L23/522
代理机构 代理人
主权项
地址