发明名称 |
CAPACITOR OF SEMICONDUCTOR DEVICE AND ITS MANUFACTURE |
摘要 |
PROBLEM TO BE SOLVED: To restrain increase of a contact resistance by preventing oxidation of a diffusion prevention film by forming a second conductive film pattern for a capacitor lower electrode filling up a second contact hole and forming a high dielectric film and a third conductive film pattern for a capacitor upper electrode. SOLUTION: A second layer insulation film pattern 41 with a second contact hole 40 which exposes a surface of a first conductive film pattern 39 is formed on a first layer insulation film pattern 33 and a first conductive film pattern 39. A second conductive film pattern 43 for a capacitor lower electrode is formed to be connected to the first conductive film pattern 39 filling in a second contact hole. A high dielectric film 45 is formed to enclose the second conductive film pattern 43. A third conductive film pattern 47 for a capacitor upper electrode is formed on the high dielectric film 45. As a result, a contact resistance can be reduced by preventing oxidation of the diffusion prevention film pattern 37. |
申请公布号 |
JP2000124426(A) |
申请公布日期 |
2000.04.28 |
申请号 |
JP19990189645 |
申请日期 |
1999.07.02 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
LEE BYOUNG-TAEK |
分类号 |
H01L23/522;H01L21/02;H01L21/28;H01L21/285;H01L21/768;H01L21/822;H01L21/8242;H01L27/04;H01L27/10;H01L27/108;H01L29/43;H01L29/92 |
主分类号 |
H01L23/522 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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