发明名称 JIG FOR OBSERVING THIN FILM SAMPLE
摘要 PROBLEM TO BE SOLVED: To hold a thin film sample and to make applicable a tensile force by equipping an observation jig with a holding part and a movable plate traveling means that consist of a sample placement plate and a movable plate and pinch a thin film sample that is passed from the movable plate to the side of the sample placement plate in the sample placement plate and the movable plate. SOLUTION: The jig 1 consists of a sample placement plate 2 and a movable plate 3, one surface of the sample placement plate 2 becomes a sample arrangement surface 4 and an L-shaped stay 5 is extended from a corner part, and an empty part 7 for sliding is formed at one side of a body 6 while it is pinched by the body 6 of the sample placement plate 2 and the stay 5. A rod-shaped slide guide 8 that is passed to the release side of the empty part 7 is fed through one end of the movable plate 3 and the other end of the movable plate 3 is supported so that it can travel to a guide groove 9 being formed inside the base part of the stay 5, thus moving the movable plate 3 in one direction being flush with the sample placement plate 2. An end face part on the side of the body 6 is provided with a movable plate traveling means 10 that is screwed to the movable plate 3. The sample placement plate 2 and the movable plate 3 are respectively provided with a holding part 12 to hold the end part of a thin film sample.
申请公布号 JP2000121515(A) 申请公布日期 2000.04.28
申请号 JP19980290743 申请日期 1998.10.13
申请人 TOPPAN PRINTING CO LTD 发明人 SUGAYA NOBUYASU;YANAKA ASAAKI
分类号 G01N1/28;G01N3/00;G01N37/00;G01Q30/08;G01Q30/20;(IPC1-7):G01N1/28 主分类号 G01N1/28
代理机构 代理人
主权项
地址