Method for examining the quality of material by measuring photon emission in different gaseous atmospheres

摘要

The present invention relates to a method for examining the quality or the quality changes of a specimen of material by measuring the intensity of photons emitted by the material, which has been excited by submission to a white light source, in air and in CO2, and correlating the measured intensities and comparing this result with similar measurements of fresh samples. Furthermore, the invention relates to a device for implementing the method, and use of the method for examining the quality of material.