发明名称 |
METHOD FOR FORMING TRENCH CAPACITOR WITHIN TRENCH HAVING HIGH ASPECT RATIO AND TRENCH CAPACITOR |
摘要 |
PURPOSE: A method for forming trench capacitor within high-aspect-ratio trench and a trench capacitor are provided to completely fill a deep trench. CONSTITUTION: A method for forming trench capacitor within a high-aspect-ratio trench comprises (a) a step depositing a filling layer(30') on top surface of a wafer and trenches(10,10'), and (b) a step heat-treating the filling layer under the temperature more than melting point of the filling layer and less than melting point of the wafer. The filling layer consists of material among group consisted of germanium and silicon-germanium alloy. On the top of the filling layer, a cap layer(36) is deposited between the steps(a,b).
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申请公布号 |
KR20000022698(A) |
申请公布日期 |
2000.04.25 |
申请号 |
KR19990032898 |
申请日期 |
1999.08.11 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION. |
发明人 |
ECONOMICOS REIERTIS;PARK, BYUNG JU |
分类号 |
H01L27/108;H01L21/334;H01L21/8242;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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