Method of determining charged-device model test data for electronic housing components

摘要

The method involves measuring the discharge current for different housing types using a charged-device model or CDM measurement arrangement for a defined pre-charge voltage. At least one specific peak value is determined from each discharge current characteristic. A first CDM failure voltage is measured for a housing part (2) with a certain semiconducting component (5) and a first housing type. A further CDM failure voltage is measured for the same semiconducting component in a further housing type (7) from the ratio of the measured specific peak current values of the first and further housing types multiplied by the first CDM failure voltage.