| 摘要 |
A method is provided that increases the manufacturing yield of semiconductor and liquid crystal devices comprising at least one defined region. The defined region is subdivided into a plurality of sub-regions, which are electrically connected in parallel. If a defect is present in the defined region, it makes only one or more sub-regions inoperable, while the remaining sub-regions function. The functioning sub-regions are combined and their outputs normalized so that the output of the defined region is unchanged, as if the sub-region effected by the defect did not exist. |
