发明名称 Thermal conditioning apparatus
摘要 A wafer support including a plate having a top surface and a lift element opening extending trough said plate. The support also includes a support member adjacent the top surface having a proximal end, a distal end and a bore from the proximal to the distal end and a vacuum source in communication with the bore. The support furthermore includes a lift element having a contacting end disposed through the lift element opening and a drive coupled to at least one of the plate and the lift element.
申请公布号 US6051074(A) 申请公布日期 2000.04.18
申请号 US19990250071 申请日期 1999.02.12
申请人 MICRON TECHNOLOGY, INC. 发明人 STRODTBECK, TIMOTHY A.;MOLEBASH, JOHN S.;HAYES, BRUCE L.;SMITH, REX A.;DAVIS, SHAWN D.
分类号 B25B11/00;H01L21/00;H01L21/687;(IPC1-7):C23C16/00;C23C14/00;C23F1/02 主分类号 B25B11/00
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