发明名称 Highly sensitive positive photoresist composition
摘要 Positive resists sensitive to UV, electron beam, and x-ray radiation which are alkaline developable are formulated from a polymer material comprising recurrent structures having alkaline soluble groups pendent to the polymer backbone, a portion of which groups are substituted with acid labile groups.
申请公布号 US6051659(A) 申请公布日期 2000.04.18
申请号 US19970961186 申请日期 1997.10.30
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 MERRITT, DAVID PAUL;MOREAU, WAYNE MARTIN;WOOD, ROBERT LAVIN
分类号 C08F8/00;G03F7/039;(IPC1-7):C08F8/00 主分类号 C08F8/00
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