发明名称 SEMICONDUCTOR DEVICE ESD PROTECTION CIRCUIT
摘要 PURPOSE: An ESD(Electro Static Discharge) protection circuit of a semiconductor device is provided to increase the dimension of second breakdown current of unit area of a device used as the ESD protection circuit, thereby enhancing ESD characteristics. CONSTITUTION: A p-well(22) is formed on a n type semiconductor substrate(21). An insulating layer(23) of predetermined depth is formed on the semiconductor substrate(21). A body layer(24) is formed by implanting n type impurities into all surface of the semiconductor substrate(21) including the insulating layer(23). A gate oxide(25) and a gate electrode(26) are formed on a portions on the body layer(24). Source/drain areas(28,27) are formed on the body layer of both sides of the gate electrode(26). a pad is connected to the drain area(27). A ground line(Vss) is commonly connected to the gate electrode and source area.
申请公布号 KR100252877(B1) 申请公布日期 2000.04.15
申请号 KR19970067446 申请日期 1997.12.10
申请人 HYUNDAI MICRO ELECTRONICS CO.,LTD. 发明人 JEONG, HYUK-JAE
分类号 H01L27/06;(IPC1-7):H01L27/06 主分类号 H01L27/06
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