发明名称 |
SEMICONDUCTOR DEVICE ESD PROTECTION CIRCUIT |
摘要 |
PURPOSE: An ESD(Electro Static Discharge) protection circuit of a semiconductor device is provided to increase the dimension of second breakdown current of unit area of a device used as the ESD protection circuit, thereby enhancing ESD characteristics. CONSTITUTION: A p-well(22) is formed on a n type semiconductor substrate(21). An insulating layer(23) of predetermined depth is formed on the semiconductor substrate(21). A body layer(24) is formed by implanting n type impurities into all surface of the semiconductor substrate(21) including the insulating layer(23). A gate oxide(25) and a gate electrode(26) are formed on a portions on the body layer(24). Source/drain areas(28,27) are formed on the body layer of both sides of the gate electrode(26). a pad is connected to the drain area(27). A ground line(Vss) is commonly connected to the gate electrode and source area.
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申请公布号 |
KR100252877(B1) |
申请公布日期 |
2000.04.15 |
申请号 |
KR19970067446 |
申请日期 |
1997.12.10 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO.,LTD. |
发明人 |
JEONG, HYUK-JAE |
分类号 |
H01L27/06;(IPC1-7):H01L27/06 |
主分类号 |
H01L27/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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