发明名称 Fresnel zone mask for pupilgram
摘要 A test photomask comprising a fresnel zone target (FZT) pattern may be used to verify the adjustment of a precision projector illumination system of an image projection system. The method comprises the steps of creating the FZT pattern on a photomask, projecting a pupil diagram onto an image plane using the FZT pattern, and evaluating the pupil diagram to determine the illumination system adjustment.
申请公布号 US6048651(A) 申请公布日期 2000.04.11
申请号 US19980177951 申请日期 1998.10.23
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BRUNNER, TIMOTHY A.;KIRK, JOSEPH P.;PROGLER, CHRISTOPHER J.
分类号 G03F1/08;G03F1/14;G03F7/20;(IPC1-7):G03F9/00 主分类号 G03F1/08
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