发明名称 PROBER
摘要 PROBLEM TO BE SOLVED: To realize a small-sized and light-weight prober with a stage which will not be tilted, even if a needle is brought into contact with it. SOLUTION: A prober provided with a stage which carries on itself a wafer disposed with a plurality of semiconductor chips and a probe to be brought into contact with electrode pads of each semiconductor chip. The stage is constituted of a mounting table 11 for mounting a wafer on, guides 22, 23, 24 for regulating the vertical movements of the mounting table, and a plurality of actuators for energizing a plurality of spots for the mounting table 11, so as to move the mounting table 11 vertically.
申请公布号 JP2000091389(A) 申请公布日期 2000.03.31
申请号 JP19980252536 申请日期 1998.09.07
申请人 TOKYO SEIMITSU CO LTD 发明人 CHIBA KIYOTAKA
分类号 G01R31/26;H01L21/66;(IPC1-7):H01L21/66 主分类号 G01R31/26
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