FILM CARRIER TAPE AND TESTING METHOD THEREFOR

摘要

PURPOSE: A film carrier tape and method of testing the same are provided to enable a reduction in the number of required measuring terminal by tester used in testing after mounting a semiconductor chip and a detection in short-circuit between lead terminals. CONSTITUTION: The film carrier tape includes a plurality of lead terminals which are respectively disposed on a insulating film(10) and provided with one end thereof connected to a semiconductor chip and another end thereof having electrically selecting pads. The method comprises the steps of: performing a short-circuit test independently for a plurality of lead terminals through the electrically selecting pads of two or more lead terminals which are not adjacent to each other before mounting the semiconductor chip; and simultaneously executing an electrical selection for a plurality of lead terminals through the electrically selecting pads of two or more lead terminals which are not adjacent to each other after mounting the semiconductor chip. Thereby, it is possible to reduce the number of required measuring terminal by tester used in testing after mounting a semiconductor chip and to detect the short-circuit between lead terminals.