METHOD FOR TESTING A SEMICONDUCTOR CIRCUIT

摘要

PURPOSE: A method for testing a semiconductor circuit is provided, which successively turns on a wordline without the increasement of a test time using a multiplexer and a magnet reproducing circuit. CONSTITUTION: The method for testing a semiconductor circuit comprises the steps of: providing a test mode signal to a magnetic reproducing counter (58); changing the operation of the magnetic reproducing counter (58) and successively activating a wordline using the magnetic reproducing counter (58); maintaining the wordline as the activated state during a predetermined time; and inactivating the wordline, wherein the magnetic reproducing counter (58) successively activates and inactivates the wordline during a non-test mode. Thereby, it is possible to efficiently detecting a fault circuit.