发明名称 Epitaxial layer for dissolved wafer micromachining process
摘要 <p>Micromachining a microelectromechanical structure requires one or more heavily doped silicon layers. Intricately patterned structures are created in a heavily doped surface layer on a relatively undoped substrate. The substrate is subsequently dissolved in a selective etch. The doping prevents the patterned structures from dissolving. In this invention, a doped layer is grown epitaxially onto the first substrate rather than by diffusing a dopant into the substrate. This produces additional planarity, thickness control, and dopant profile control. The structure may then be placed into a larger device, such as an infrared sensor, an accelerometer, or an angular rate sensor. &lt;IMAGE&gt;</p>
申请公布号 EP0987740(A1) 申请公布日期 2000.03.22
申请号 EP19980203096 申请日期 1998.09.16
申请人 THE BOEING COMPANY 发明人 HAYS, KENNETH MAXWELL;HALLECK, BRADLEY LEONARD;WHITCOMB, EUGENE COLEMAN
分类号 H01L21/306;B81B3/00;F15C5/00;H01L29/84;(IPC1-7):H01L21/20;G01P15/08 主分类号 H01L21/306
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