发明名称 High-voltage generator for word lines of a bank-activated semiconductor memory device
摘要 A semiconductor memory device operates at a high speed by applying high-voltage used for driving word lines in accordance with an activated state of a bank by using a high-voltage circuit controlled for each bank or by inserting control circuits in each output stage of the high-voltage circuit in the memory device adopting a number of banks. The memory device includes a high-voltage generation circuit that includes a number of unit high-voltage generation circuits that output a high-voltage of the same level, and a multi-bank circuit that includes a number of unit bank circuits driven independently in response to the high-voltage signal of a corresponding unit high-voltage generation circuit, a corresponding row decoder output signal and a corresponding column decoder output signal.
申请公布号 US6038178(A) 申请公布日期 2000.03.14
申请号 US19980219852 申请日期 1998.12.23
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. 发明人 OH, YOUNG NAM
分类号 G11C11/413;G11C8/08;G11C11/401;G11C11/407;G11C11/4074;G11C11/408;(IPC1-7):G11C7/00 主分类号 G11C11/413
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