发明名称 |
High-voltage generator for word lines of a bank-activated semiconductor memory device |
摘要 |
A semiconductor memory device operates at a high speed by applying high-voltage used for driving word lines in accordance with an activated state of a bank by using a high-voltage circuit controlled for each bank or by inserting control circuits in each output stage of the high-voltage circuit in the memory device adopting a number of banks. The memory device includes a high-voltage generation circuit that includes a number of unit high-voltage generation circuits that output a high-voltage of the same level, and a multi-bank circuit that includes a number of unit bank circuits driven independently in response to the high-voltage signal of a corresponding unit high-voltage generation circuit, a corresponding row decoder output signal and a corresponding column decoder output signal.
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申请公布号 |
US6038178(A) |
申请公布日期 |
2000.03.14 |
申请号 |
US19980219852 |
申请日期 |
1998.12.23 |
申请人 |
HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. |
发明人 |
OH, YOUNG NAM |
分类号 |
G11C11/413;G11C8/08;G11C11/401;G11C11/407;G11C11/4074;G11C11/408;(IPC1-7):G11C7/00 |
主分类号 |
G11C11/413 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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