发明名称 Temperature control apparatus for sample susceptor
摘要 A temperature control apparatus for a sample susceptor is described, the temperature control apparatus is easy to maintain, which can set a temperature in a wide range from a low temperature to a high temperature, which is compact and which does not require a special processing for disposing of a cooling medium. A temperature control apparatus for a sample susceptor has a cooling unit for cooling a sample susceptor on which a wafer W is mounted, an electric heater for heating the sample susceptor, a temperature detecting unit for detecting the temperature of the sample susceptor, and a temperature adjusting unit for controlling the cooling unit and the heating unit based on a detection signal of the temperature detecting unit. The cooling unit has an electro-pneumatic regulator for generating a high-pressure gas of a predetermined pressure from a received gas and supplying the generated high-pressure gas by an electric control, and a vortex tube for generating a low-temperature gas based on a vortex flow generated by receiving a high-pressure gas in the tangent direction within the tube and for supplying this low-temperature gas, so that the low-temperature gas is supplied from the vortex tube to a gas flow path formed within the sample susceptor.
申请公布号 US6032724(A) 申请公布日期 2000.03.07
申请号 US19970935913 申请日期 1997.09.23
申请人 TOKYO ELECTRON LIMITED 发明人 HATTA, MASATAKA
分类号 H01L21/66;F25B9/04;G01R31/28;H01L21/00;H01L21/683;(IPC1-7):C23F1/02 主分类号 H01L21/66
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