| 摘要 |
In a thermal head apparatus, temperatures of heat generation elements can be individually detected directly so that an abnormal condition of any heat generation element can be detected. A plurality of unit heat generation elements, each formed from a resistor whose electric resistance value varies depending upon its temperature, are arranged in a row. A driving circuit is provided for each unit heat generation element to supply an electric current to the unit heat generation element. A temperature detection circuit is provided for each unit heat generation element, and extracts from the unit heat generation element an electric signal which is obtained as a result of a variation of a resistance value caused by a variation in temperature of the unit heat generation element itself. An abnormal-condition detection circuit is provided for each unit heat generation element, and detects the presence or absence of an abnormal condition of the unit heat generation element from an output of the temperature detection circuit.
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