| 摘要 |
The processor measures complex permittivity as a function of two or more frequencies of the field at a given temperature, and determines at least one parameter chosen from form, dimension, volume fraction, co-continuous fraction of the second phase and Debye length of the charge layer. A measuring device for the properties of a multi-phase system containing at least two phases with different electrical conductivity in contact with each other, comprises electrodes (15) for generating an electrical field inside the multi-phase system and creating a charge layer in at least the contact region between the phases, and a processor (25) connected to the electrodes in order to measure the complex permittivity of the system. The processor measures complex permittivity as a function of two or more frequencies of the field at a given temperature, and determines at least one parameter chosen from form, dimension, volume fraction, co-continuous fraction of the second phase and Debye length of the charge layer using a first equation (I) relating frequency-dependent complex permittivity of the system to at least the real part of the permittivity for the first phase and at least the real part of the permittivity for the second phase. (I) defines a size factor linking the real part of the permittivity of the second phase to the size effect, volume fraction of the second phase and a form factor defined by the form of the second phase. A second equation (II) can also be used, if necessary, relating the size factor to the second phase dimension and Debye length of the charge layer, along with an optional third equation (III) relating form factor to the form of the second phase. Independent claims are also included for (a) a production apparatus containing the measuring device, including a transport device for conveying the multi-phase system between the electrodes at a given speed set according to the form and/or size of the second phase, (b) a similar production apparatus where the mixing device for generating the multi-phase system is controlled by the form and/or size of the second phase, and (c) a method for measuring the properties of a multi-phase system using this device. |
