发明名称 |
TRENCH ISOLATING METHOD OF SEMICONDUCTOR INTEGRATED CIRCUITS |
摘要 |
PURPOSE: A trench isolating method is provided to prevent a formation of recessed groove formed at edge portion of the isolation layer by using a flowable oxide pattern as isolating insulator. CONSTITUTION: The method comprises the steps of forming a trench by etching a semiconductor substrate(11) using a mask pattern(18); growing a thermal oxide(19) to recover the damaged substrate(11) at sidewalls and bottom portion of the trench; filling a flowable oxide pattern(21a) into the trench; removing the mask pattern(18) using wet-etchant and simultaneous deforming the flowable oxide pattern(21a) to a deformed flowable oxide pattern(21b) having a recessed groove formed at edge portion(B) thereof; and annealing the deformed flowable oxide pattern(21b), thereby forming an isolating oxide pattern(21c) covered the recessed groove.
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申请公布号 |
KR20000007803(A) |
申请公布日期 |
2000.02.07 |
申请号 |
KR19980027318 |
申请日期 |
1998.07.07 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HWANG, SEON HA;SIMADA TAKASI |
分类号 |
H01L21/76;H01L21/316;H01L21/762;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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