发明名称 TRENCH ISOLATING METHOD OF SEMICONDUCTOR INTEGRATED CIRCUITS
摘要 PURPOSE: A trench isolating method is provided to prevent a formation of recessed groove formed at edge portion of the isolation layer by using a flowable oxide pattern as isolating insulator. CONSTITUTION: The method comprises the steps of forming a trench by etching a semiconductor substrate(11) using a mask pattern(18); growing a thermal oxide(19) to recover the damaged substrate(11) at sidewalls and bottom portion of the trench; filling a flowable oxide pattern(21a) into the trench; removing the mask pattern(18) using wet-etchant and simultaneous deforming the flowable oxide pattern(21a) to a deformed flowable oxide pattern(21b) having a recessed groove formed at edge portion(B) thereof; and annealing the deformed flowable oxide pattern(21b), thereby forming an isolating oxide pattern(21c) covered the recessed groove.
申请公布号 KR20000007803(A) 申请公布日期 2000.02.07
申请号 KR19980027318 申请日期 1998.07.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HWANG, SEON HA;SIMADA TAKASI
分类号 H01L21/76;H01L21/316;H01L21/762;(IPC1-7):H01L21/76 主分类号 H01L21/76
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