发明名称 |
FABRICATING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method of forming a storage node contact plug is provided to make etching depth and diameter of a storage node contact window shallow and short, respectively. CONSTITUTION: The method comprises the steps of sequentially forming a first to a fourth insulating layers on an overall surface of a semiconductor substrate having buried contact plugs; sequentially etching the fourth and the first insulating layers down to surfaces of the buried contact plugs to form first contact holes on the buried contact plugs; forming a photoresist pattern on the fourth insulating layer including the first contact holes; sequentially etching the fourth and the third insulating layers using the photoresist pattern as a mask to form second contact holes between the first contact holes and on the second insulating layer; and filling the first and the second contact holes with conductive material after removal of the photoresist pattern.
|
申请公布号 |
KR20000008404(A) |
申请公布日期 |
2000.02.07 |
申请号 |
KR19980028194 |
申请日期 |
1998.07.13 |
申请人 |
SAMSUNG ELECTRONICS CO, LTD. |
发明人 |
JANG, SUN GYU |
分类号 |
H01L21/28;H01L21/768;H01L21/8242;H01L27/108;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|