发明名称 FABRICATING METHOD OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method of forming a storage node contact plug is provided to make etching depth and diameter of a storage node contact window shallow and short, respectively. CONSTITUTION: The method comprises the steps of sequentially forming a first to a fourth insulating layers on an overall surface of a semiconductor substrate having buried contact plugs; sequentially etching the fourth and the first insulating layers down to surfaces of the buried contact plugs to form first contact holes on the buried contact plugs; forming a photoresist pattern on the fourth insulating layer including the first contact holes; sequentially etching the fourth and the third insulating layers using the photoresist pattern as a mask to form second contact holes between the first contact holes and on the second insulating layer; and filling the first and the second contact holes with conductive material after removal of the photoresist pattern.
申请公布号 KR20000008404(A) 申请公布日期 2000.02.07
申请号 KR19980028194 申请日期 1998.07.13
申请人 SAMSUNG ELECTRONICS CO, LTD. 发明人 JANG, SUN GYU
分类号 H01L21/28;H01L21/768;H01L21/8242;H01L27/108;(IPC1-7):H01L21/28 主分类号 H01L21/28
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