发明名称 Circuit board testing apparatus and method
摘要 To conduct a continuity test in a short period of time using a moving head type testing apparatus a probe is made to contact one end of the test wiring of a circuit board (32), with a head (52) electrostatically coupled to the other end of the wiring, a pulse-like DC voltage is suplied from a signal source (46). Simultaneously with a switch section (SWp) turning on, the maximum voltage is applied to the test wiring. If a detection signal is below a specified value a computer (44) will determine this as "openning" or "shorting". Further, a tip (52a) of the head (52) may touch the circuit board (32) through an insulating sheet (33), so that the tip (52a) is kept away from each pad of a pad section (38) in the circuit board (32) at a fixed distance equivalent to the thickness of the insulating sheet (33). Thus a continuity test may be performed in a non-contact manner by moving the head (52) only along the X and Y directions without additional movement along the Z-direction. <IMAGE>
申请公布号 EP0919820(A3) 申请公布日期 2000.02.02
申请号 EP19980120161 申请日期 1998.10.28
申请人 NIDEC-READ CORPORATION 发明人 YAMASHITA, MUNEHIRO;KAIDA, MITIO
分类号 G01R31/02;G01R1/073;G01R31/28;G01R31/304;G01R31/312;H05K3/00 主分类号 G01R31/02
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