| 摘要 |
PROBLEM TO BE SOLVED: To inspect an electronic unit in a short time by converting an analog data in the electronic unit into a digital data by an inspection microcomputer, and transmitting the digital data from the microcomputer. SOLUTION: An electronic unit 1 is incorporated into an apparatus, and a plurality of loads 21 that are controlled by the unit 1 are connected. An inspection device 4 communicates data with an inspection microcomputer 3, and the switching signal of the loads 21 is transmitted directly to a control microcomputer 2. When an inspection start signal is transmitted from the device 4 to the microcomputer 2 via the inspection microcomputer 3, the microcomputer 2 enters a test mode, conducts a test program, and performs inspection. However, since the loads 21 are connected, the loads 21 that are successively operated by a signal from the device 4 are switched, and at the same time each of the loads 21 is inspected. Analog data at a test point is converted into digital data by the inspection microcomputer 3, thus transmitting a digital signal to the device 4.
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