发明名称 SEMICONDUCTOR DEVICE AND METHOD THEREOF
摘要 PURPOSE: A semiconductor device and method thereof are provided to prevent a thinning phenomenon of film thickness of resist by forming a gentle slope between a memory cell region and a peripheral region. CONSTITUTION: The device comprises a memory cell block(4) having a plurality of capacitors(32b,21a) formed on a main surface(11a) of a silicon substrate(11). The exterior surface of edge portions of the capacitor(21a) of the memory cell block(4) has an upper face(52a) extended by a first height from the main surface(11a) of the silicon substrate(11) and a lower face(21d) extended by a second height having a low height compared to the first height from the main surface(11a) of the silicon substrate(11).
申请公布号 KR20000005577(A) 申请公布日期 2000.01.25
申请号 KR19990003202 申请日期 1999.02.01
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 KOBAYASI HEIJI
分类号 H01L27/108;H01L21/8242;H01L27/105;(IPC1-7):H01L27/105 主分类号 H01L27/108
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