发明名称 |
SEMICONDUCTOR DEVICE AND METHOD THEREOF |
摘要 |
PURPOSE: A semiconductor device and method thereof are provided to prevent a thinning phenomenon of film thickness of resist by forming a gentle slope between a memory cell region and a peripheral region. CONSTITUTION: The device comprises a memory cell block(4) having a plurality of capacitors(32b,21a) formed on a main surface(11a) of a silicon substrate(11). The exterior surface of edge portions of the capacitor(21a) of the memory cell block(4) has an upper face(52a) extended by a first height from the main surface(11a) of the silicon substrate(11) and a lower face(21d) extended by a second height having a low height compared to the first height from the main surface(11a) of the silicon substrate(11).
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申请公布号 |
KR20000005577(A) |
申请公布日期 |
2000.01.25 |
申请号 |
KR19990003202 |
申请日期 |
1999.02.01 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
KOBAYASI HEIJI |
分类号 |
H01L27/108;H01L21/8242;H01L27/105;(IPC1-7):H01L27/105 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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