发明名称 METHOD FOR FORMING SILICIDE CONDUCTIVE LINE OF SEMICONDUCTOR DEVICES
摘要 PURPOSE: A forming method of silicide conductive lines is provided to prevent an impurity diffusion and reduce a resistivity of the conductive line by making amorphous the silicide layer. CONSTITUTION: The method comprises the steps of: sequentially depositing a gate polysilicon layer(12) doped phosphorous and a tungsten silicide layer(13) on a silicon substrate(10); making amorphous the silicide layer(13) by ion-implanting to the silicide layer; patterning the tungsten silicide layer(13) and the gate polysilicon layer(12) using en etching mask for forming a gate electrode; and recrystallizing the amorphous silicide layer by performing an annealing process.
申请公布号 KR20000003954(A) 申请公布日期 2000.01.25
申请号 KR19980025262 申请日期 1998.06.30
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 KIM, HYUN SOO;LEE, SANG MOO
分类号 H01L21/265;(IPC1-7):H01L21/265 主分类号 H01L21/265
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