发明名称 METHOD FOR FORMING ISOLATION LAYER OF SEMICONDUCTOR DEVICES
摘要 PURPOSE: A forming method of an isolation layer is provided to prevent a bird's beak by simple process using LOCOS(LOCal Oxidation of Silicon) technique. CONSTITUTION: The method comprises the steps of: sequentially forming a pad oxide(11) and a nitride layer(12) on a semiconductor substrate(10); exposing an inactive region of the semiconductor substrate(10) by excess etching the nitride layer and the pad oxide to form a groove(13) for preventing a bird's beak; forming an amorphous silicon layer((14) on the exposed substrate and the etched nitride layer; forming an amorphous silicon pattern(15) in the exposed substrate by ion-implanting; and forming an isolation layer(16) by LOCOS the resultant structure using the nitride layer(12) as an oxidation mask.
申请公布号 KR20000003749(A) 申请公布日期 2000.01.25
申请号 KR19980025021 申请日期 1998.06.29
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 HAN, SANG GYU
分类号 H01L21/76;(IPC1-7):H01L21/76 主分类号 H01L21/76
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