发明名称 |
METHOD FOR MANUFACTURING GATE ELECTRODE OF SEMICONDUCTOR DEVICES |
摘要 |
PURPOSE: A fabrication method a gate electrode is provided to improve a reliability and properties of devices by using a sloped masking insulator formed on the gate electrode. CONSTITUTION: The manufacturing method comprises the steps of: sequentially forming a gate insulator(14), a conductive layer(16), a masking insulator(18) and an anti-reflection layer(20) on a semiconductor substrate(12); patterning the anti-reflection layer(20) and the masking insulator(18) using a photoresist pattern(22) as an etching mask; slope etching the anti-reflection layer pattern and the upper edge of the masking insulator pattern by sputtering used argon(Ar) gases; forming a gate electrode by etching the conductive layer(16) and the gate insulator(14) using the sloped anti-reflection mask and the sloped masking insulator as a mask; and forming an insulator spacer(24) at both sidewalls of the resultant structure.
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申请公布号 |
KR20000003634(A) |
申请公布日期 |
2000.01.25 |
申请号 |
KR19980024894 |
申请日期 |
1998.06.29 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
KIM, DAE YEONG;CHOE, DEUK SEONG |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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