发明名称 METHOD FOR MANUFACTURING GATE ELECTRODE OF SEMICONDUCTOR DEVICES
摘要 PURPOSE: A fabrication method a gate electrode is provided to improve a reliability and properties of devices by using a sloped masking insulator formed on the gate electrode. CONSTITUTION: The manufacturing method comprises the steps of: sequentially forming a gate insulator(14), a conductive layer(16), a masking insulator(18) and an anti-reflection layer(20) on a semiconductor substrate(12); patterning the anti-reflection layer(20) and the masking insulator(18) using a photoresist pattern(22) as an etching mask; slope etching the anti-reflection layer pattern and the upper edge of the masking insulator pattern by sputtering used argon(Ar) gases; forming a gate electrode by etching the conductive layer(16) and the gate insulator(14) using the sloped anti-reflection mask and the sloped masking insulator as a mask; and forming an insulator spacer(24) at both sidewalls of the resultant structure.
申请公布号 KR20000003634(A) 申请公布日期 2000.01.25
申请号 KR19980024894 申请日期 1998.06.29
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 KIM, DAE YEONG;CHOE, DEUK SEONG
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
代理机构 代理人
主权项
地址