发明名称 |
METAL WIRE FORMING METHOD FOR SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A metal wire forming method is provided to produce a metal wire preventing the loss of Si according to the reaction of a silicon substrate to an adhesion layer. CONSTITUTION: A metal wire is formed by the steps of: evaporating an interlayer insulating film(3) onto a silicon substrate(1) and forming a bit line contact hole to expose a contact layer(2) by etching the interlayer insulating film; evaporating polycrystalline silicon film(4) onto the exposed contact layer; and evaporating Ti film(5) onto the whole structure, Ti film(6) thereunto and tungsten film(7) thereunto.
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申请公布号 |
KR20000003359(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980024589 |
申请日期 |
1998.06.27 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD |
发明人 |
LEE, SANG HYUP |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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