发明名称 METAL WIRE FORMING METHOD FOR SEMICONDUCTOR DEVICE
摘要 PURPOSE: A metal wire forming method is provided to produce a metal wire preventing the loss of Si according to the reaction of a silicon substrate to an adhesion layer. CONSTITUTION: A metal wire is formed by the steps of: evaporating an interlayer insulating film(3) onto a silicon substrate(1) and forming a bit line contact hole to expose a contact layer(2) by etching the interlayer insulating film; evaporating polycrystalline silicon film(4) onto the exposed contact layer; and evaporating Ti film(5) onto the whole structure, Ti film(6) thereunto and tungsten film(7) thereunto.
申请公布号 KR20000003359(A) 申请公布日期 2000.01.15
申请号 KR19980024589 申请日期 1998.06.27
申请人 HYUNDAI ELECTRONICS IND. CO., LTD 发明人 LEE, SANG HYUP
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
代理机构 代理人
主权项
地址
您可能感兴趣的专利