CIRCUIT FOR CHANGING PAD FUNCTION

摘要

PURPOSE: A pad function changing circuit is provided to allow proving pads not used at probe test to be used as pads of different function. CONSTITUTION: The pad function changing circuit comprises: a latch(2) for latching a switching control signal in response to a write enable signal(WCBR) and a test mode detection signal(TMOP), wherein the switching control signal switches an output terminal of an address pad(1) supplying an address signal(ADD12); and transmission gates(TM1, TM2) for connecting the output terminal of the address pad(1) either to an input terminal of an input buffer n a probe test circuit or to an internal power pad(3).