发明名称 Method of fabricating cylinder capacitors
摘要 A method of fabricating cylinder capacitors is provided comprising forming a first conductive layer and a dielectric layer on the semiconductor substrate. A via is formed in the dielectric layer. Then, a second conductive layer and a top oxide layer are formed on the dielectric layer. Part of the top oxide layer and the second conductive layer is removed by pattering the photoresist layer. A first spacer is formed at a side wall of the top oxide layer and the second conductive layer. The second conductive layer is etched by using the top oxide layer and the first spacer as a mask. Then, the top oxide layer is removed to form a second spacer. The second spacer is used as a mask in etching the second conductive layer to form a cup-shaped lower electrode. Further, a dielectric film layer and an upper electrode are formed to make a cylinder capacitor.
申请公布号 US6001682(A) 申请公布日期 1999.12.14
申请号 US19980059319 申请日期 1998.04.13
申请人 UNITED MICROELECTRONICS CORP. 发明人 CHIEN, SUN-CHIEH
分类号 H01L21/02;H01L21/8242;H01L27/108;(IPC1-7):H01L21/824;H01L21/20 主分类号 H01L21/02
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