发明名称 |
HIGH-EMITTANCE ELECTRON SOURCE HAVING HIGH IRRADIATION UNIFORMITY |
摘要 |
<p>PROBLEM TO BE SOLVED: To form electron beams having uniform intensity in the large area and a large angle of beam divergence, applicable especially to an electron beam projection system and a lithography tool. SOLUTION: This electron source includes a negative electrode 10 having a planar main emission surface 10', a positive electrode 16 having an aperture and approximately parallel to the planar emission surface, and an arrangement 50 to uniformly heat the negative electrode in a comparatively large area by electron and photon impact on the surface of the negative electrode opposite to the planar main emission surface 10'. Both the direct heating by a large area filament and the indirect heating by the impact by the emission from an auxiliary negative electrode are provided in probably plural stages.</p> |
申请公布号 |
JPH11329317(A) |
申请公布日期 |
1999.11.30 |
申请号 |
JP19990098318 |
申请日期 |
1999.04.06 |
申请人 |
INTERNATL BUSINESS MACH CORP <IBM> |
发明人 |
STEPHEN D GORADY;RODNEY K KENDALL;KARL E BOHNENKAMP |
分类号 |
H01J37/06;H01J1/20;H01J9/04;H01J37/075;(IPC1-7):H01J37/075 |
主分类号 |
H01J37/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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