发明名称 HIGH-EMITTANCE ELECTRON SOURCE HAVING HIGH IRRADIATION UNIFORMITY
摘要 <p>PROBLEM TO BE SOLVED: To form electron beams having uniform intensity in the large area and a large angle of beam divergence, applicable especially to an electron beam projection system and a lithography tool. SOLUTION: This electron source includes a negative electrode 10 having a planar main emission surface 10', a positive electrode 16 having an aperture and approximately parallel to the planar emission surface, and an arrangement 50 to uniformly heat the negative electrode in a comparatively large area by electron and photon impact on the surface of the negative electrode opposite to the planar main emission surface 10'. Both the direct heating by a large area filament and the indirect heating by the impact by the emission from an auxiliary negative electrode are provided in probably plural stages.</p>
申请公布号 JPH11329317(A) 申请公布日期 1999.11.30
申请号 JP19990098318 申请日期 1999.04.06
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 STEPHEN D GORADY;RODNEY K KENDALL;KARL E BOHNENKAMP
分类号 H01J37/06;H01J1/20;H01J9/04;H01J37/075;(IPC1-7):H01J37/075 主分类号 H01J37/06
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