发明名称 |
Non-volatile semiconductor and memory cell and method for production thereof |
摘要 |
A non-volatile semiconductor memory cell employing a field effect transistor having a gate of the metal/ferroelectric structure or the metal/ferroelectric/metal/insulator structure, wherein the ferroelectric layer is a layer of bismuth titanate containing bismuth more than the stoichiometric quantity or a piled layer of bismuth titanate of the stoichiometric composition and bismuth titanate containing bismuth more than the stoichiometric quantity, both of which have a less amount of dielectric constant and remanent polarization, thereby enabling the non-volatile memory cell to memorize and erase binary information with a less amount of voltage to be applied to the gate.
|
申请公布号 |
US5989927(A) |
申请公布日期 |
1999.11.23 |
申请号 |
US19980003521 |
申请日期 |
1998.01.06 |
申请人 |
OKI ELECTRIC INDUSTRY CO., LTD. |
发明人 |
YAMANOBE, TOMOMI |
分类号 |
H01L21/28;H01L21/336;H01L29/78;(IPC1-7):H01L21/00 |
主分类号 |
H01L21/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|