发明名称 Non-volatile semiconductor and memory cell and method for production thereof
摘要 A non-volatile semiconductor memory cell employing a field effect transistor having a gate of the metal/ferroelectric structure or the metal/ferroelectric/metal/insulator structure, wherein the ferroelectric layer is a layer of bismuth titanate containing bismuth more than the stoichiometric quantity or a piled layer of bismuth titanate of the stoichiometric composition and bismuth titanate containing bismuth more than the stoichiometric quantity, both of which have a less amount of dielectric constant and remanent polarization, thereby enabling the non-volatile memory cell to memorize and erase binary information with a less amount of voltage to be applied to the gate.
申请公布号 US5989927(A) 申请公布日期 1999.11.23
申请号 US19980003521 申请日期 1998.01.06
申请人 OKI ELECTRIC INDUSTRY CO., LTD. 发明人 YAMANOBE, TOMOMI
分类号 H01L21/28;H01L21/336;H01L29/78;(IPC1-7):H01L21/00 主分类号 H01L21/28
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