发明名称 APPARATUS AND METHOD FOR CONDUCTIVITY MEASUREMENT INCLUDING PROBE CONTAMINATION COMPENSATION
摘要 <p>A conductivity measurement system provides one or more DC pulses to first an d second electrodes submerged in an aqueous solution such as, for instance, th e wash water of an industrial dishwasher. The voltage at the first electrode i s measured at first and second predetermined times after initiation of DC pulse(s). Linear regression of the first and second measured voltages is use d to calculate the voltage at the first electrode at the beginning of the DC pulse(s), i.e., at time t=0. The resulting voltage at time t=0 is then used to calculate the conductivity of the solution, thereby compensating for the effects of polarization. Further, the difference between the respective firs t and second measured voltages is compared to a predetermined threshold value to determine whether the electrodes are so contaminated that polarization compensation is no longer feasible, thereby signaling that the electrodes should be cleaned or replaced.</p>
申请公布号 CA2327745(A1) 申请公布日期 1999.11.18
申请号 CA19992327745 申请日期 1999.05.07
申请人 UNILEVER PLC 发明人 CHAN, WAI YIN CEDRIC;LIVINGSTON, JAMES WESLEY
分类号 A47L15/42;G01N27/06;(IPC1-7):G01R27/22;D06F39/00 主分类号 A47L15/42
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