发明名称 SRAM having P-channel TFT as load element with less series-connected high resistance
摘要 A memory cell for a semiconductor device includes two pairs of a transfer transistor and a drive transistor at a first level and a pair of load transistors above the two pairs of transfer and drive transistors at a second level. Each of the load transistors includes a gate, a source/drain, and a channel. The cell further includes a pair of contacts extending between the first and second levels and that connect one of the gates to a respective one of the two pairs of transfer and drive transistors. Each load transistor gate includes a portion that overlies its respective channel and a lateral extension therefrom that contacts a respective one of the contacts. The extension of one load transistor gate overlaps the source/drain of the other load transistor adjacent the respective one of the contacts.
申请公布号 US5973369(A) 申请公布日期 1999.10.26
申请号 US19970816038 申请日期 1997.03.11
申请人 NEC CORPORATION 发明人 HAYASHI, FUMIHIKO
分类号 H01L21/8244;H01L21/84;H01L27/11;(IPC1-7):H01L29/76;H01L29/94;H01L31/062;H01L31/113 主分类号 H01L21/8244
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