发明名称 Process for etching semiconductor wafers
摘要 A semiconductor wafer etching process uses an etchant mixture which is formed by mixing nitric and hydrofluoric acids and optionally a surface active agent and which is subsequently topped up with hydrofluoric acid and optionally nitric acid. The novelty is that the etchant mixture is formed by mixing either ≥ 70 wt.% nitric acid and greater than 50 wt.% hydrofluoric acid or greater than 70 wt.% nitric acid and ≥ 50 wt.% hydrofluoric acid, preferably 73-98 wt.% nitric acid and greater than 60 to 95 wt.% hydrofluoric acid. The or each topping-up acid may have the same concentration or a 5-10% higher concentration than the corresponding acid used to form the mixture.
申请公布号 SG67503(A1) 申请公布日期 1999.09.21
申请号 SG19980001059 申请日期 1998.05.15
申请人 WACKER SILTRONIC GESELLSCHAFT FUER HALBLEITERMATERIALIEN AG. 发明人 BAUER THERESIA;WEIZBAUER SUSANNE;BERGLER ALFRED;WOCHNER HANNS
分类号 H01L21/306;H01L21/308 主分类号 H01L21/306
代理机构 代理人
主权项
地址