发明名称 INSPECTING METHOD FOR LIQUID CRYSTAL DISPLAY DEVICE AND LIQUID CRYSTAL DISPLAY DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To execute a completion inspection whose efficiency is satisfactory timewisely, in space and cost by performing operation inspections of peripheral driving circuits and a TEG inspection sumultaneously while using inspection terminals in which a peripheral driving circuit inspecting terminal group and a TEG inspecting terminal group are arranged in the same inspecting terminal group. SOLUTION: TEG elements 18a, 18b are connected to an inspecting terminal group 14. The inspecting terminal group 14 is constituted of the arrangement of terminals having a fixed pitch and size and this device has a constitution in which a scan signal driving circuit 8, a picture signal driving circuit 11, picture signal lines 2, an X-axis clock pulse output signal line 16 and a Y-axis clock pulse output signal line 17 are connected to the same rank as that of the TEG elements 18a, 18b. Thus, the operation inspection as the functional check of a liquid crystal display device of its own and the TEG inspection as a process control monitor can be completed by the inspection of one time while using the same device with respect to the inspecting terminal group 14 of one group by constituting the liquid crystal device like this.</p>
申请公布号 JPH11242239(A) 申请公布日期 1999.09.07
申请号 JP19980042695 申请日期 1998.02.25
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 OTOMO TETSUYA;KAWAMURA TETSUYA
分类号 G02F1/1345;G02F1/136;G02F1/1368;(IPC1-7):G02F1/136;G02F1/134 主分类号 G02F1/1345
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