| 摘要 |
A guided-probe test fixture is disclosed for connecting circuit cards having electronic components to a board test system. The test fixture utilizes long, leaning or vertical test probes, guide plates and limited probe tip travel in order to achieve high-accuracy, fine-pitch probing of limited-access, no-clean test targets. The guided-probe test fixture of the present invention also utilizes spring probes, probe-mounting plates, personality pins and an alignment plate in order to couple test targets with multiplexed tester resources. The guided-probe test fixture of the present invention may also utilize a universal interface plate with double-headed spring probes and/or a wireless interface printed circuit board to facilitate the electrical coupling of test targets to tester resources. Accordingly, the guided-probe test fixture of the present invention is capable of sophisticated in-circuit and functional testing of a loaded-printed circuit board containing both standard-access and limited-access, no-clean test targets. The present invention is also capable of improved probing accuracy, improved no-clean testability and improved fine-pitch probing of limited-access test targets, while at the same time capable of probing standard-access test targets.
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