发明名称 METHOD AND DEVICE FOR INSPECTING DEFECT IN PRINTED MATTER
摘要 PROBLEM TO BE SOLVED: To output a defect detection signal at a position corresponding to a defect developing site irrespective of the running speed of a printed matter by a method wherein the defect detection signal is inputted in a shifter actuating in synchronous with a line pulse so as to output the detect detection signal at a position retarded by a predetermined distance on the screen from the defect developing position. SOLUTION: Inspecting images N, N+1..., which are inputted from a line sensor 12 to an image inputting part 20 are stored one drawing by one drawing in an inspecting image memory part 22. Further, a defect judging part 24 judges the defect of the read-out image and outputs a defect detection. An inspecting image changing- over part 26 changes over an image, which synchronizes with a Z-phase pulse and is inputted from the inputting part 20 to the memory part 22, for an inspecting image outputting from the memory part 22 to the judging part 24. Further, a memory 30 for a shifter actuating in synchronous with a line pulse, a detect data writing-in part 32, which writes the defect detection signal in the memory 30, a read-out address forming part 34 and a detect data reading-out part 36 are provided so as to input the defect detection signal in the shifter in order to output the detection signal at a position retarded by a predetermined distance on the screen from the defect developing position.
申请公布号 JPH11227168(A) 申请公布日期 1999.08.24
申请号 JP19980031099 申请日期 1998.02.13
申请人 DAINIPPON PRINTING CO LTD;OMRON CORP 发明人 SATO HIROSHI;MATSUNAMI TAKESHI
分类号 B41F33/14;G06T1/00;G06T7/00 主分类号 B41F33/14
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