发明名称 Laser interferometer system for straightness measurements
摘要 <p>A laser interferometer system in particular for measuring the straightness of an object is described. This interferometer employs first prisms (15,16) to refract parallel laser beams by certain angles with respect to the principal axis of an incident beam, and prism reflectors (17,18,19) at least one of which (17,18) includes a refraction surface for introducing an optical path length difference upon transverse movement perpendicular to the principal axis. Three embodiments are described. A first is for long-range measurements and after leaving the first prisms the beams (23,43) are parallel when they reach the prism reflectors, one of which is a retroreflector and the other of which has a refraction surface. In the other embodiments the beams (23,36) after leaving the first prisms either converge or diverge respectively, and the prism reflectors (17,18) both include refraction surfaces arranged to refract the beams in opposite senses. <IMAGE></p>
申请公布号 EP0932021(A1) 申请公布日期 1999.07.28
申请号 EP19980300436 申请日期 1998.01.21
申请人 THE HONG KONG UNIVERSITY OF SCIENCE & TECHNOLOGY 发明人 CAI, LILONG, DR.;ZHANG, JIHUA, DR.
分类号 G01B9/02;G01B11/30;(IPC1-7):G01B11/30 主分类号 G01B9/02
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