| 摘要 |
PROBLEM TO BE SOLVED: To provide a pattern generator capable of generating random test pattern streams with a high detection rate, which can not be achieved by a conventional pattern detector, without requiring any high-level programming knowledge while effectively utilizing a conventional device without damaging conventional functions by additionally providing the conventional pattern generator with a random number generation module (high-speed programmable pattern generator). SOLUTION: The pattern generator for generating a test pattern for IC test check or the like according to the operation sequence of a program stored in a microprogram memory is additionally provided with a random number generation module 16 for generating programmable patterns at a high speed under the control of the above program and with a memory module 14 for storing the test pattern data for random logic generated by the relevant module and further, simultaneous use with an algorithmic pattern generator(ALPG) module 15 is enabled. |
