发明名称 Semiconductor integrated circuit device with diagnostic circuit using resistor
摘要 In a semiconductor integrated circuit device, a signal processing circuit includes an output control circuit and an output circuit and is composed of a plurality of MOS transistors. The signal processing circuit inputs a circuit signal and processes the circuit signal. A diagnostic circuit includes at least a diagnostic resistor indicative of a gate length of each of the plurality of MOS transistors and generates a diagnosis signal based on a resistance value of the diagnostic resistor. The output control circuit controls the output circuit to one of an output enable state and an output disable state based on the diagnosis signal.
申请公布号 US5917333(A) 申请公布日期 1999.06.29
申请号 US19970788444 申请日期 1997.01.28
申请人 NEC CORPORATION 发明人 OGAWA, HISAO
分类号 G01R31/28;H01L21/66;H01L21/822;H01L27/04;(IPC1-7):G01R31/26 主分类号 G01R31/28
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