| 摘要 |
PROBLEM TO BE SOLVED: To create an LSI test pattern which shortens the test time of an LSI and which prevents a concurrence operation of an input/output terminal. SOLUTION: A concurrence point detection part 6 detects the concurrence point of an LSI test pattern 5 so as to output concurrence generating point information 7. A concurrence pattern correction part 8 corrects the LSI test pattern 5 in the concurrence point on the basis of the concurrence generating point information 7 so as to output an LSI nonconcurrence test pattern 9. A concurrence preventive system for the LSI test pattern has an effect to shorten the test time of an LSI, because it can prevent a concurrent operation without inserting a mask pattern into the test pattern. |
