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发明名称
TEST PATTERN GENERATION METHOD OF IC TESTER
摘要
申请公布号
JPH11149795(A)
申请公布日期
1999.06.02
申请号
JP19970313819
申请日期
1997.11.14
申请人
ANDO ELECTRIC CO LTD
发明人
TAMURA KENJI
分类号
G01R31/28;G11C29/00;G11C29/10;G11C29/56;(IPC1-7):G11C29/00
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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