发明名称 Halbleiteranordnung vom Druckkontakttyp
摘要 <p>An alloy-free pressure contact type semiconductor device maintains a high reliability during transportation even without a pressure contact tool such as a simplified stack and therefore does not require a high transportation cost. Through holes (H1) and (H2) each having a circular cross section are formed in distortion buffer plates (21A) and (21K) at the center. A first and a second bottomed holes (i.e., recesses) (N1) and (N2) are formed in an anode electrode plate (41A) and a cathode electrode plate (41K). From the through hole (H1) up to the first bottomed hole (N1), a pressure contact pin (9) biased by a coil spring (8) is disposed. From the through hole (H2) down to the second bottomed hole (N2), a fixing pin (90) is disposed. Without applying external pressure upon the device, it is possible to prevent displacement of the first and the second distortion buffer plates due to vibration or impact during transportation and damage to a semiconductor body. Therefore, a transportation cost is low and the reliability of the device is high. <IMAGE></p>
申请公布号 DE69509285(D1) 申请公布日期 1999.06.02
申请号 DE1995609285 申请日期 1995.02.16
申请人 MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP 发明人 TAGUCHI, KAZUNORI, C/O FUKURIO SEMICONDUCTOR, NISHI-KU, FUKUOKA-SHI, FUKUOKA 819-01, JP;HIRASAWA, KYOUTARO, C/O MITSUBISHI DENKI K.K., NISHI-KU, FUKUOKA-SHI, FUKUOKA 819-01, JP;KONISHI, YUZURA, C/O MITSUBISHI DENKI K.K., NISHI-KU, FUKUOKA-SHI, FUKUOKA 819-01, JP
分类号 H01L21/52;H01L23/051;H01L23/48;H01L29/861;(IPC1-7):H01L23/48 主分类号 H01L21/52
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